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| 54114 Records Searched | 53 Matches |
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 |  | FCT Assembly Secures ITAR Registration Monday, August 16, 2010 | PRLog ITAR documents FCT's dedication to adhering to the regulations that control the import and export of defense-related articles and services on the United States Munitions List. FCT also updated its registration for ISO 9001:2008.
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 |  | Electronics Industry Braces for ROHS Recast Thursday, August 12, 2010 | EDN An expected recast of the RoHS (restriction of hazardous substances) environmental directive will likely carve away exclusions and possibly add new substances to the current list of six banned substances.
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 |  | Drop Test: Lead-Free Board After Assembly and Rework Tuesday, April 27, 2010 | P. Snugovsky, J. Bragg, E. Kosiba, M. Thomson, B. Lee, R. Brush, S. Subramaniam, M. Romansky, Celestica; A. Ganster, Crane Division NSWC; W. Russell, Raytheon; J. P. Tucker, C. A. Handwerker, Purdue University; and D. D. Fritz, SAIC This award-winning paper from APEX 2010 examines how the transition to lead-free materials in the general electronics industry significantly impacts the mechanical reliability of solder joint interconnects, a fact widely recognized by the consumer electronics industry.
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|  | Beat the Heat: A Non-Math Intro to Thermal Properties Tuesday, April 27, 2010 | Chet Guiles, Arlon Consultant Lead-free solder technology has resulted in stresses on PTHs due to higher temperature excursions and cracks in solders that are more brittle than their tin-lead ancestors. Since most devices exhibit a mean time to failure that is cut in half with every 10 degrees C temperature increase, managing temperature is critical to product life expectancy.
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 |  | DA5 Consortium to Explore Lead-Free Solutions Wednesday, April 21, 2010 | Business Wire Bosch (Division Automotive Electronics), Freescale Semiconductor, Infineon Technologies, NXP Semiconductors and STMicroelectronics today announced that they have formed a consortium to jointly investigate and standardize the acceptance of alternatives for high-lead solder for attaching die to semiconductor packages during manufacturing.
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 |  | Real Time with...IPC Produces Over 100 Videos Wednesday, April 14, 2010 | Real Time With...IPC APEX Expo 2010 I-Connect007's team of editors, guest editors, videographers and video editors worked throughout the show to capture the keynotes, the industry's top technologists and business leaders, bringing our readers and viewers the world's most comprehensive event coverage and content.
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 |  | Design-for-Environment Webinar Features Experts Thursday, March 18, 2010 | Technology Forecasters Inc. On April 7th, Technology Forecasters Inc. (TFI) President Pamela J. Gordon and Design Chain Associates (DCA) President Mike Kirschner will co-lead a 90-minute webinar entitled Design for Environment and Competitive Advantage.
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 |  | Counterfeit Electronics: Threats, Risks and Prevention Practices Tuesday, March 16, 2010 | Lev Shapiro, Component Master Ltd. Product counterfeiting accounts for more than 8% of global merchandise trade and is equivalent to as much as $600 billion in lost sales. Counterfeit items used in computers, aircraft, cars, telecommunications and medical devices are a serious risk for national security, health and safety.
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 |  | New Solder Eliminates Toxic Lead Monday, March 08, 2010 | CleanTechnica.com A team of researchers at Yale University has developed a new kind of magnetic, lead free solder that could be used to manufacture electronics more cheaply and efficiently.
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 |  | Evaluation of Halogen-Free Laminates Used in Handheld Electronics Tuesday, August 10, 2010 | David Lau and Y. Norman Zhou, University of Waterloo; Laura J. Turbini and Julie Liu, Research in Motion This paper examines the thermal properties of various halogen-free laminates used in handheld electronic products and correlates these properties with manufacturing requirements. Thermal properties investigated include z-axis CTE, time to delamination at 260°C and 288°C and temperature to decomposition.
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|  | Creep Corrosion of OSP and ImAg PWB Finishes Tuesday, July 06, 2010 | C. Xu, W. Reents, J. Franey, J. Yaemsiri and J. Devaney, Alcatel-Lucent The effect of post-reflow cleaning processes on creep corrosion are discussed in this paper from Alcatel-Lucent.The authors examine a laboratory MFG test that replicates field creep corrosion. Comparisons of creep corrosion susceptibility between OSP and ImAg PWB surface finishes are also made.
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 |  | Real Time with...IPC Produces Over 100 Videos Wednesday, April 14, 2010 | Real Time With...IPC APEX Expo 2010 I-Connect007's team of editors, guest editors, videographers and video editors worked throughout the show to capture the keynotes, the industry's top technologists and business leaders, bringing our readers and viewers the world's most comprehensive event coverage and content.
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 |  | Counterfeit Electronics: Threats, Risks and Prevention Practices Tuesday, March 16, 2010 | Lev Shapiro, Component Master Ltd. Product counterfeiting accounts for more than 8% of global merchandise trade and is equivalent to as much as $600 billion in lost sales. Counterfeit items used in computers, aircraft, cars, telecommunications and medical devices are a serious risk for national security, health and safety.
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 |  | Reliability Issues for Hi-Rel Military Boards Tuesday, January 12, 2010 | Terry Costlow, IPC Lead-free is changing the way military boards are specified. Product designers are finding that, as more boards use components that have lead-free solder, they must re-evaluate every aspect of their designs.
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 |  | Perspectives: Cutting Through the Lead-Free Alloy Clutter Tuesday, January 05, 2010 | Clyde Coombs The list of replacements for eutectic tin-lead keeps growing, and now, over three years after implementation of the lead-free mandate, new alloys are still being developed. How do you cut through the clutter and find the right alloy?
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 |  | ANI Receives Funding for Remediation of Tin Whiskers Monday, November 23, 2009 | Marketwire Applied Nanotech Holdings, Inc. announced that it has been selected by the U.S. Missile Defense Agency (MDA) to receive an award of approximately $500,000 for the development of non-contact methods for mitigation of tin whiskers from electronic devices.
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 |  | Perspectives: Lead-Free Looking for the Holy Grail Wednesday, October 28, 2009 | Clyde Coombs At the moment, the search for the Holy Grail--a solder that is a direct replacement for tin-lead--has lost a few participants, but the quest goes on within solder manufacturers. However, a replacement seems as elusive as the original.
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 |  | Inside Look: SMART Group 25th Anniversary Seminar Tuesday, October 27, 2009 | Pete Starkey, I-Connect007 Chairman Keith Bryant welcomed over 80 delegates to SMART Group's 25th Anniversary Seminar in Thame, near Oxford, UK, October 22, 2009. The seminar offered up-to-the-minute information on process technology, reliability, environmental and business advances.
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 |  | Materials Sourcing Studied as Regulators Ponder Legislation Monday, October 05, 2009 | IPC The regulatory environment may take a new twist. U.S. legislators are considering a bill that would require companies to track the origin of raw materials, raising several questions about reporting and enforcement.
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 |  | Evaluation of Halogen-Free Laminates Used in Handheld Electronics Tuesday, August 10, 2010 | David Lau and Y. Norman Zhou, University of Waterloo; Laura J. Turbini and Julie Liu, Research in Motion This paper examines the thermal properties of various halogen-free laminates used in handheld electronic products and correlates these properties with manufacturing requirements. Thermal properties investigated include z-axis CTE, time to delamination at 260°C and 288°C and temperature to decomposition.
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|  | Reid on Reliability: The Corner Crack Wednesday, July 07, 2010 | Paul Reid, PWB Corner cracks are observed less often than barrel cracks, but with high-rel boards, we can't be too careful. Unlike barrel cracks, which can fail catastrophically, knee cracks tend to propagate over time. The damaged pad actually resembles a funnel and the warp and weft of the glass give the funnel an uneven, puckered shape.
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|  | Creep Corrosion of OSP and ImAg PWB Finishes Tuesday, July 06, 2010 | C. Xu, W. Reents, J. Franey, J. Yaemsiri and J. Devaney, Alcatel-Lucent The effect of post-reflow cleaning processes on creep corrosion are discussed in this paper from Alcatel-Lucent.The authors examine a laboratory MFG test that replicates field creep corrosion. Comparisons of creep corrosion susceptibility between OSP and ImAg PWB surface finishes are also made.
|
 |  | Drop Test: Lead-Free Board After Assembly and Rework Tuesday, April 27, 2010 | P. Snugovsky, J. Bragg, E. Kosiba, M. Thomson, B. Lee, R. Brush, S. Subramaniam, M. Romansky, Celestica; A. Ganster, Crane Division NSWC; W. Russell, Raytheon; J. P. Tucker, C. A. Handwerker, Purdue University; and D. D. Fritz, SAIC This award-winning paper from APEX 2010 examines how the transition to lead-free materials in the general electronics industry significantly impacts the mechanical reliability of solder joint interconnects, a fact widely recognized by the consumer electronics industry.
|
|  | Beat the Heat: A Non-Math Intro to Thermal Properties Tuesday, April 27, 2010 | Chet Guiles, Arlon Consultant Lead-free solder technology has resulted in stresses on PTHs due to higher temperature excursions and cracks in solders that are more brittle than their tin-lead ancestors. Since most devices exhibit a mean time to failure that is cut in half with every 10 degrees C temperature increase, managing temperature is critical to product life expectancy.
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 |  | Counterfeit Electronics: Threats, Risks and Prevention Practices Tuesday, March 16, 2010 | Lev Shapiro, Component Master Ltd. Product counterfeiting accounts for more than 8% of global merchandise trade and is equivalent to as much as $600 billion in lost sales. Counterfeit items used in computers, aircraft, cars, telecommunications and medical devices are a serious risk for national security, health and safety.
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 |  | Is There an Incipient Rebellion Against Lead-Free Solder? Tuesday, February 2, 2010 | Harvey Miller, IConnect007 IPC's Technet offers a snapshot of the issues of the day as hundreds of engineers attempt to sort out the industry's latest technological challenges. Harvey Miller, PCB007 columnist and President of Fabfile Online, has agreed to gather a few of the latest Technet exchanges for our Tech Tuesday readers.
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 |  | Reliability Issues for Hi-Rel Military Boards Tuesday, January 12, 2010 | Terry Costlow, IPC Lead-free is changing the way military boards are specified. Product designers are finding that, as more boards use components that have lead-free solder, they must re-evaluate every aspect of their designs.
|
 |  | Perspectives: Cutting Through the Lead-Free Alloy Clutter Tuesday, January 05, 2010 | Clyde Coombs The list of replacements for eutectic tin-lead keeps growing, and now, over three years after implementation of the lead-free mandate, new alloys are still being developed. How do you cut through the clutter and find the right alloy?
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 |  | Good Quality, High Reliability Are Not an Accident Tuesday, November 24, 2009 | Pete Starkey, I-Connect007 "Good quality and high reliability are not an accident: They are there by design!" These were the opening words of Artetch Circuits' Martin Morrell as he introduced the SMART Group seminar on high-technology, high-reliability PCBs at the UK's NPL on November 17, 2009.
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|  | Reid on Reliability: The Corner Crack Wednesday, July 07, 2010 | Paul Reid, PWB Corner cracks are observed less often than barrel cracks, but with high-rel boards, we can't be too careful. Unlike barrel cracks, which can fail catastrophically, knee cracks tend to propagate over time. The damaged pad actually resembles a funnel and the warp and weft of the glass give the funnel an uneven, puckered shape.
|
|  | Beat the Heat: A Non-Math Intro to Thermal Properties Tuesday, April 27, 2010 | Chet Guiles, Arlon Consultant Lead-free solder technology has resulted in stresses on PTHs due to higher temperature excursions and cracks in solders that are more brittle than their tin-lead ancestors. Since most devices exhibit a mean time to failure that is cut in half with every 10 degrees C temperature increase, managing temperature is critical to product life expectancy.
|
 |  | Is There an Incipient Rebellion Against Lead-Free Solder? Tuesday, February 2, 2010 | Harvey Miller, IConnect007 IPC's Technet offers a snapshot of the issues of the day as hundreds of engineers attempt to sort out the industry's latest technological challenges. Harvey Miller, PCB007 columnist and President of Fabfile Online, has agreed to gather a few of the latest Technet exchanges for our Tech Tuesday readers.
|
 |  | Perspectives: Cutting Through the Lead-Free Alloy Clutter Tuesday, January 05, 2010 | Clyde Coombs The list of replacements for eutectic tin-lead keeps growing, and now, over three years after implementation of the lead-free mandate, new alloys are still being developed. How do you cut through the clutter and find the right alloy?
|
 |  | Good Quality, High Reliability Are Not an Accident Tuesday, November 24, 2009 | Pete Starkey, I-Connect007 "Good quality and high reliability are not an accident: They are there by design!" These were the opening words of Artetch Circuits' Martin Morrell as he introduced the SMART Group seminar on high-technology, high-reliability PCBs at the UK's NPL on November 17, 2009.
|
 |  | Perspectives: Lead-Free Looking for the Holy Grail Wednesday, October 28, 2009 | Clyde Coombs At the moment, the search for the Holy Grail--a solder that is a direct replacement for tin-lead--has lost a few participants, but the quest goes on within solder manufacturers. However, a replacement seems as elusive as the original.
|
 |  | Inside Look: SMART Group 25th Anniversary Seminar Tuesday, October 27, 2009 | Pete Starkey, I-Connect007 Chairman Keith Bryant welcomed over 80 delegates to SMART Group's 25th Anniversary Seminar in Thame, near Oxford, UK, October 22, 2009. The seminar offered up-to-the-minute information on process technology, reliability, environmental and business advances.
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|  | The Lead-Free Revolution: Three Years Later, Where Are We? Wednesday, September 30, 2009 | Clyde Coombs Lead-free was neither market-driven nor a clear next-generation of technology--it was government imposed. Now that we are three years past the official start date, there should be signs of industry standards, agreed upon "best practices" and specifications emerging. This does not seem to be the case.
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 |  | An Inside Look: Fourth Annual IeMRC Conference Monday, September 07, 2009 | Pete Starkey, I-Connect007 Delegates and speakers from all over the world gathered at Henry Ford College, University of Loughborough, for the IeMRC conference. A truly outstanding conference, superb organisation, an excellent venue, the highest calibre of presenters and an attentive full-house audience--for what more could one ask?
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